Varela M., Arenholz E., Liu K., Takamura Y., Murray P.D., Gilbert D.A., Grutter A.J., Kirby B.J., Hernandez-Maldonado D., Brubaker Z.E., Liyanage W.L., Chopdekar R.V., Taufour V., Zieve R.J., Jeffries J.R., Borchers J.A.
Ключевые слова: coated conductors, fabrication, MOD process, cap layers, manganites, buffer layers, critical caracteristics, X-ray diffraction, roughness, surface, lattice parameter, critical current density, temperature dependence, microstructure, critical current, distribution, experimental results, HTS, YBCO
Chen C., Zhao Y., Huhtinen H., Paturi P., Zhu J., Wu Y., Palonen H., Khan M.Z., Rivasto E., Tikkanen J.
Ключевые слова: HTS, YBCO, coated conductors, doping effect, fabrication, IBAD process, buffer layers, cap layers, template layers, critical caracteristics, critical current, anisotropy, lattice parameter, magnetization, temperature dependence, critical current, angular dependence, Jc/B curves, microstructure, defects, experimental results
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanoparticles, nanocomposites, doping effect, nanoscaled effects, pinning, cap layers, buffer layers, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, pinning force, magnetic field dependence, critical temperature, experimental results
Ключевые слова: HTS, YBCO, coated conductors, critical caracteristics, critical current density, fabrication, cap layers, magnetron sputtering, surface, microstructure, roughness
Ключевые слова: HTS, coated conductors, REBCO, substrate Hastelloy, critical caracteristics, thickness dependence, CORC cables, microstructure, critical current, magnetic field dependence, electropolishing process, defects, buffer layers, fabrication, texture, uniformity, MOCVD process, cap layers, mechanical properties, stress effects, strain effects, tensile tests, experimental results, presentation
Ключевые слова: patents, HTS, coated conductors, cap layers, solution techniques, YBCO, fabrication
Paranthaman M., Aytug T., Christen D.K., Thompson J.R., Kim K., Selvamanickam V., Polat O., Qiu X., Lupini A.R., Meyer H.M.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, pinning, PLD process, substrate SrTiO3, films, cap layers, nanoscaled effects, phase formation, phase separation, fabrication, microstructure, size effect, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: HTS, films, YBCO, chemical solution deposition, coating-pyrolysis process, TFA route, fabrication, phase formation, nucleation, cap layers, grain boundaries, porosity, presentation
Ключевые слова: HTS, YBCO, coated conductors, FCL resistive, Bi2212, bulk, design parameters, resistance, temperature dependence, cap layers, ac losses, economic analysis, presentation, power equipment
Ключевые слова: presentation, HTS, YBCO, coated conductors, cap layers, inkjet printing, fabrication, microstructure
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Isfort D., Puig T., Palau A., Obradors X., Bock J., Pomar A., Sandiumenge F., Pinol S., Mestres N., Castano O., Coll M., Cavallaro A., Gazquez J., Gonzalez J.C., Gutierrez J., Roma N., Ricart S., Moreto J.M., Zalamova K., Morlens S., Hassini A., Gibert M.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, electrodeposition, substrate Ni-W, cap layers, texture, fabrication, RABITS process, microstructure, crack formation, PLD process, MOD process, stabilizing layers, current-voltage characteristics, collaborations, presentation, critical caracteristics
Ключевые слова: patents, HTS, coated conductors, substrate metallic, REBCO, other HTS, buffer layers, magnetron sputtering, cap layers, PLD process, fabrication
Paranthaman M., Salama K., Kang S., Lee D.F., Bhuiyan M.S.(s9r@ornl.gov)
Ключевые слова: HTS, YBCO, substrate Ni-W, buffer layers, MOD process, barriers, cap layers, magnetron sputtering, PLD process, fabrication, texture, microstructure, Jc/B curves, critical caracteristics
Takahashi K., Muroga T., Shiohara Y., Watanabe T., Kato T., Yamada Y., Hirayama T., Miyata S., Konishi M., Ibi A.
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Ключевые слова: coated conductors, IBAD process, buffer layers, PLD process, cap layers, reel-to-reel process, long conductors, grain alignment, fabrication
Izumi T., Shiohara Y., Watanabe T., Yamada Y., Miyata S., Ibi A., Muroga T.(muroga.takemi@hitachi-cable.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, cap layers, reel-to-reel process, texture, long conductors, fabrication, high rate process, PLD process
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, buffer layers, cap layers, texture, chemical solution deposition, reel-to-reel process, microstructure, fabrication, length
Ключевые слова: patents, HTS, coated conductors, cap layers, buffer layers, YBCO, fabrication
Rupich M.W., Thieme C.L., Arendt P.N., Foltyn S.R., Li Q., Annavarapu S., Fritzemeier L.G., Siegal E.J., Thompson E.D.
Ключевые слова: patents, fabrication, HTS, coated conductors, buffer layers, cap layers, substrate Ni alloy, texture
Izumi T., Shiohara Y., Watanabe T., Kato T., Yamada Y., Iwai H., Muroga T.(muroga@istec.or.jp), Sugawara Y., Hirayama T., Miyata S., Sasaki H.
Watanabe T., Maeda T., Mimura M., Ohashi Y., Hirabayashi I.(hirazum@istec.or.jp)
Osamura K., Ono T., Hirabayashi I., Matsumoto K., Takechi A.(takechi@kumax.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, cap layers, PLD process, microstructure, critical current density, fabrication, critical caracteristics
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